Patent · US Active

Method for test case generation

US7865780B2 · kind B2 · utility

6Cited by

3References

9Claims

0Family size

Assignee

SAP AG · DE

Inventors

Stefan Dipper · Wiesloch, DE
Peter John · Heidelberg, DE

Key dates

Filing date	Oct 5, 2007
Grant date	Jan 4, 2011
Priority date	—
Expiry date	Oct 31, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3684
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system and method for providing randomly-generated test cases for a set of interfaces of a piece of software are disclosed. A test case generator is initialized with parameter arrays Sp with cardinality mp and a prime number qp. For each independent parameter p of each of the set of interfaces, a test case number t is generated. A test case is then generated based on the values for each independent parameter p and based on t and Sp, mp, and qp.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.