System and method for automated detection of singular faults in diode or'd power bus circuits
US7868637B2 · kind B2 · utility
3Cited by
7References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 15, 2007 |
| Grant date | Jan 11, 2011 |
| Priority date | — |
| Expiry date | Jun 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system automatically detects singular faults in diode or'd power bus circuit comprised of a plurality of diodes. The system includes a diode test circuit that selectively applies a voltage pulse to one of the plurality of diodes and detects the presence of singular faults based on the monitored response to the voltage pulse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.