Patent · US Active

System and method for test probe management

US7868780B2 · kind B2 · utility

15Cited by

5References

20Claims

0Family size

Assignee

JDS Uniphase Corporation · US

Inventors

Glen Engel · Snohomish, US
Glen L. Purdy, Jr. · Snohomish, US
Jerry Liu · Palo Alto, US

Key dates

Filing date	Sep 20, 2005
Grant date	Jan 11, 2011
Priority date	—
Expiry date	Feb 13, 2028

Classification

Technology area (CPC H)Electricity
CPC primaryH04Q9/00
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

Individual probe management is accomplished in a measurement system by communicating configuration data to each probe based on that probe's received metadata. In one embodiment, the configuration data is sent from a server and the server does not keep track of the probe's configuration. The configuration data can be, for example, parameters used to directly configure the probe or software modules for running on the probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.