Apparatus for the electromagnetic spectrum or optical analysis, in particular photometric, spectrophotometric or image analysis
US7869028B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 12, 2006 |
| Grant date | Jan 11, 2011 |
| Priority date | — |
| Expiry date | Jun 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/15
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for the electromagnetic spectrum or optical analysis of a material. The apparatus comprising a measuring probe having a housing with at least one radiation or light measuring element, a measuring window and with at least one detection element for the analysis. The measuring probe is formed and guided displaceably in the axial direction in such a way that at least part of the housing in which the measuring window is located enters through an opening in which the material to be analyzed is located for the analysis. The at least one measuring window is arranged in at least one subregion of the circumferential wall of the housing. A sealing cap is located between a front end face of the housing and the measuring window arranged in the circumferential wall and consequently covers the opening in a retracted position of the measuring probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.