Broad-range spectrometer
US7869038B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2008 |
| Grant date | Jan 11, 2011 |
| Priority date | — |
| Expiry date | Jun 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/0966
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one general aspect, a particle characterization instrument is disclosed that includes a first spatially coherent light source with a beam output aligned with an optical axis. A focusing optic is positioned along the optical axis after the coherent light source, and a sample cell is positioned along the optical axis after the focusing optic. The instrument also includes a diverging optic positioned along the optical axis after the sample cell, and a detector positioned outside of the optical axis to receive scattered light within a first range of scattering angles from the diverging optic. In another general aspect, an instrument can direct at least a portion of a first beam and at least a portion of a second beam along a same optical axis and a can receive scattered light from the sample cell resulting from interaction between the sample and either the first beam or the second beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.