Methods and apparatus for x-ray imaging with focal spot deflection
US7869571B2 · kind B2 · utility
12Cited by
11References
30Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2008 |
| Grant date | Jan 11, 2011 |
| Priority date | — |
| Expiry date | Jan 28, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/086
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Methods and apparatus for x-ray imaging with focal spot deflection are provided. The apparatus includes an x-ray tube having a cathode configured to emit electrons and an anode having a target with a target surface defining a target angle. The emitted electrons are deflected onto the target surface with the target surface substantially aligned with a z-axis parallel to a gantry rotation axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.