Method and apparatus for adjusting a sample-ion source electrode distance in a TOF mass spectrometer
US7872226B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2008 |
| Grant date | Jan 18, 2011 |
| Priority date | — |
| Expiry date | Mar 11, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0409
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In a time-of-flight mass spectrometer having an ion source with a first accelerating electrode, a distance between the surface of a sample and the first accelerating electrode is maintained at a predetermined distance which is critical for determining the mass and quantity of ions generated by the ion source. A digital image of the sample surface is obtained with a digital camera and a predetermined characteristic of the digital image is determined. The predetermined characteristic is then used to compute an adjustment amount by which the sample surface is moved to maintain the predetermined distance. Determining the predetermined characteristic can be simplified by projecting a light pattern onto the sample surface at an angle and determining the predetermined characteristic from the digital image of the pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.