Stacked well ion trap
US7872228B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 18, 2008 |
| Grant date | Jan 18, 2011 |
| Priority date | — |
| Expiry date | Feb 2, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/423
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In an apparatus for performing a mass spectrometric analysis of a sample, a plurality of electrodes are positioned and driven by RF potentials to form a plurality of adjacent pseudopotential wells. Ions may be manipulated, reacted, analyzed, and ejected from the apparatus in a manner similar to conventional ion traps. In addition, selected ions or groups of ions may be passed from one pseudopotential well to another pseudopotential well without ion losses due to physical obstructions. The apparatus may be used alone or in conjunction with other mass analyzers to produce mass spectra from analyte ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.