Testing method of head element and magnetic recording and reproducing apparatus capable of head evaluating
US7872471B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 7, 2007 |
| Grant date | Jan 18, 2011 |
| Priority date | — |
| Expiry date | Jul 19, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49004
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Provided is a method for testing a head element that enables proper evaluation of the head element based on a characteristic of the head element under high-temperature and high-stress conditions. The testing method can be performed on a thin-film magnetic head including a head element and a heating element capable of applying a heat and stress to the head element, or performed on a row bar or a substrate wafer on which a plurality of the head elements and a plurality of the heating elements are disposed. The testing method comprises the steps of: causing the heating element to generate heat to apply a heat and stress to the head element; and measuring a characteristic of the head element under the heat and stress to evaluate the head element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.