On-chip test system and method for active pixel sensor arrays
US7872645B2 · kind B2 · utility
12Cited by
5References
13Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 28, 2006 |
| Grant date | Jan 18, 2011 |
| Priority date | — |
| Expiry date | Oct 27, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/69
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image sensing chip includes an active pixel sensor array including a plurality of pixels arranged in rows and columns. A built in self test circuit is coupled to the active pixel sensor array. The built in self test circuit includes an output port adapted to be coupled to external circuitry and the built in self test circuit is operable to test the active pixel sensor array and provide the results of the test on the output port.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.