Real-time, 3D, non-linear microscope measuring system and method for application of the same
US7872748B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jan 27, 2006 |
| Grant date | Jan 18, 2011 |
| Priority date | — |
| Expiry date | Mar 28, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/22
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.