Method and apparatus for establishing reflection properties of a surface
US7872753B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 22, 2006 |
| Grant date | Jan 18, 2011 |
| Priority date | — |
| Expiry date | Mar 5, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for establishing light reflection properties of a specific surface, by measuring, for a plurality of comparison surfaces, the r-tables in accordance with CIE standard recommendations, measuring, for the same plurality of comparison surfaces, a light reflection parameter for selected angles (γ) of incident light and angles (90°−α) and (β) of reflected light, using a ‘portable’ measuring apparatus, measuring in situ, on multiple measuring points of said specific surface, said parameter for said angles (γ), (α) and (β), using said ‘portable’ apparatus, comparing the angular distribution of said parameter for the specific surface with that for said comparison surfaces, to select the comparison surface showing the best distribution fit, optionally taking into account a rescaling factor on luminance coefficient Q0, and assigning to said specific surface the ‘r-table’ corresponding to said selected comparison surface, with said optional rescaling factor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.