X-ray tomography inspection systems
US7876879B2 · kind B2 · utility
86Cited by
8References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 15, 2006 |
| Grant date | Jan 25, 2011 |
| Priority date | — |
| Expiry date | Apr 5, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/643
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray imaging inspection system for inspecting items comprises an X-ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.