Patent · US Active

Method for determining measuring points

US7877225B2 · kind B2 · utility

1Cited by
0References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 25, 2008
Grant dateJan 25, 2011
Priority date
Expiry dateJan 25, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a method for determining measurement points on a physical object, a number of measurement points are first selected in a graphical computer model of the object, until a sufficient number of measuring points have been selected so as to allow the position and orientation (lay) of the object to be determined relative to a reference system. A further measuring point of the object is then selected in the graphical computer model, and a check is automatically made to determine whether the further measuring point can determine the lay of the object relative to the reference coordinate system more accurately. If so, the further measuring point is used for this determination. Further measuring points are selected and checked in this manner, until the lay of the object can be determined better than with a predefined tolerance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.