Method for determining measuring points
US7877225B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 25, 2008 |
| Grant date | Jan 25, 2011 |
| Priority date | — |
| Expiry date | Jan 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for determining measurement points on a physical object, a number of measurement points are first selected in a graphical computer model of the object, until a sufficient number of measuring points have been selected so as to allow the position and orientation (lay) of the object to be determined relative to a reference system. A further measuring point of the object is then selected in the graphical computer model, and a check is automatically made to determine whether the further measuring point can determine the lay of the object relative to the reference coordinate system more accurately. If so, the further measuring point is used for this determination. Further measuring points are selected and checked in this manner, until the lay of the object can be determined better than with a predefined tolerance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.