Patent · US Active

Detection circuit and method for AC coupled circuitry

US7877652B1 · kind B1 · utility

1Cited by

6References

10Claims

0Family size

Assignee

QUALCOMM Incorporated · US

Inventor

Robert John Schuelke · Lakeville, US

Key dates

Filing date	Mar 31, 2003
Grant date	Jan 25, 2011
Priority date	—
Expiry date	Jan 5, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318577
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Standardized scan cell logic is enabled to test board-level and circuit-level AC interfaces built into integrated CMOS circuits by verification of high-speed AC coupled non-CMOS logic level signals driven onto non-CMOS logic level AC coupled interconnects in those circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.