Patent · US Active

Method for performing a test case with a LBIST engine on an integrated circuit, integrated circuit and method for specifying an integrated circuit

US7877655B2 · kind B2 · utility

3Cited by

7References

16Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Thuyen Le · Taufkirchen, DE
Thomas Pflueger · Echterdingen, DE
Martin Padeffke · Hildrizhausen, DE
Stefan Bonsels · Stuttgart, DE

Key dates

Filing date	Sep 14, 2007
Grant date	Jan 25, 2011
Priority date	—
Expiry date	Feb 22, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318502
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.