Patent · US Active

Multiple ion injection in mass spectrometry

US7880136B2 · kind B2 · utility

17Cited by
13References
38Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 31, 2006
Grant dateFeb 1, 2011
Priority date
Expiry dateOct 21, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/4265
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

This invention relates to mass spectrometry that includes ion trapping in at least one of the stages of mass analysis. In particular, although not exclusively, this invention relates to tandem mass spectrometry where precursor ions and fragment ions are analysed. A method of mass spectrometry is provided comprising the sequential steps of: accumulating in an ion store a sample of one type of ions to be analysed; accumulating in the ion store a sample of another type of ions to be analysed; and mass analysing the combined samples of the ions; wherein the method comprises accumulating the sample of the one type of ions and/or the sample of another type of ions to achieve a target number of ions based on the results of a previous measurement of the respective type of ions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.