System and method for detecting laser irradiated embedded material in a structure
US7880877B2 · kind B2 · utility
8Cited by
76References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2007 |
| Grant date | Feb 1, 2011 |
| Priority date | — |
| Expiry date | Sep 12, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/28
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A detection system is used during irradiation of an interaction region of a structure with laser light. The structure includes embedded material. The detection system includes means for receiving light emitted from the interaction region. The detection system further includes means for separating the received light into a spectrum of wavelengths. The detection system further includes means for analyzing at least a portion of the spectrum for indications of embedded material within the interaction region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.