Contactless optical probe and device and method making use thereof

US7880902B2 · kind B2 · utility

Assignees

• Essilor International (Compagnie Generale d'Optique) · FR
• MB Optique · FR

Inventors

• Frederic Dubois · Charenton-le-Pont, FR
• Michael Bray · San Jose, US

Key dates

• Filing date: Jan 11, 2006
• Grant date: Feb 1, 2011
• Expiry date: Aug 22, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B11/007
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The probe comprises a light source (20), means for shaping (24, 25, 21) the beam emitted by said light source and the beam coming from a surface arranged close to a target distance, an optical detector unit (22), comprising a pinhole diaphragm (26) and a photoelectric detector (28), providing a voltage peak (31) when said surface is at said target distance and further comprising a diaphragm (27) with a hole larger than said pinhole and a photoelectric detector (29), providing a voltage greater than that produced by said detection sensor (28), except when said surface is a the target distance. The method uses the probe to measure the thickness of an optical lens.