Increased switching cycle resistive memory element
US7881092B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 24, 2007 |
| Grant date | Feb 1, 2011 |
| Priority date | — |
| Expiry date | Feb 3, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2213/79
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit including a resistive memory element and a method of manufacturing the integrated circuit are described. The method of manufacturing the integrated circuit includes depositing a switching layer material and intentionally forming inhomogeneously distributed defects within the switching layer material to increase a number of switching cycles of the resistive memory element. The resistive memory element includes a switching layer that selectively switches between a low resistance state and a high resistance state. The switching layer contains intentionally formed defects that increase the number of switching cycles of the switching layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.