Method for calibrating dual-energy CT system and method of image reconstruction
US7881424B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 11, 2008 |
| Grant date | Feb 1, 2011 |
| Priority date | — |
| Expiry date | Mar 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/1648
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method for calibrating a dual-energy CT system and an image reconstruction method are disclosed to calculate images of atomic number and density of a scanned object as well as its attenuation coefficient images at any energy level. The present invention removes the effect from a cupping artifact due to X-ray beam hardening. The method for calibrating a dual-energy CT system is provided comprising steps of selecting at least two different materials, detecting penetrative rays from dual-energy rays penetrating said at least two different materials under different combinations of thickness to acquire projection values, and creating a lookup table in a form of correspondence between said different combinations of thickness and said projection values. The image reconstruction method is provided comprising steps of scanning an object with dual-energy rays to acquire dual-energy projection values, calculating projection values of base material coefficients corresponding to said dual-energy projection values based on a pre-created lookup table, and reconstructing an image of base material coefficient distribution based on said projection values of base material coefficients. In this way,…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.