Systems and methods for implant virtual review
US7885441B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 11, 2006 |
| Grant date | Feb 8, 2011 |
| Priority date | — |
| Expiry date | Dec 9, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Certain embodiments of the present invention provide systems and methods for virtual implant review. Certain embodiments provide a method for virtual implant review. The method includes registering a two-dimensional image and a three-dimensional image. The method includes detecting an implant or instrument in the two-dimensional image. The method also includes performing an initial implant registration of the implant or instrument with respect to the three dimensional image based on navigation information and refining the initial implant registration based on image data analysis to generate a refined implant registration. Additionally, the method includes displaying a representation of the implant or instrument with respect to the three-dimensional image based on the refined image registration and the refined implant registration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.