Method for manufacturing a semiconductor body with a trench and semiconductor body with a trench
US7888234B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2008 |
| Grant date | Feb 15, 2011 |
| Priority date | — |
| Expiry date | Dec 20, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/76205
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for manufacturing a semiconductor body with a trench comprises the steps of etching the trench (11) in the semiconductor body (10) and forming a silicon oxide layer (12) on at least one side wall (14) of the trench (11) and on the bottom (15) of the trench (11) by means of thermal oxidation. Furthermore, the silicon oxide layer (12) on the bottom (15) of the trench (11) is removed and the trench (11) is filled with polysilicon that forms a polysilicon body (13).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.