Mass spectrometer using a dynamic pressure ion source
US7893401B2 · kind B2 · utility
16Cited by
11References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 20, 2006 |
| Grant date | Feb 22, 2011 |
| Priority date | — |
| Expiry date | Apr 22, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/164
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A mass spectrometer has a pulsed ion source, a first ion trap (10) for trapping ions generated by the pulsed ion source and for locating trapped ions for subsequent ejection from the first ion trap. A pulse of cooling gas is introduced into the first ion trap (10) at a peak pressure suitable for enabling the first ion trap (10) to trap ions. A turbomolecular pump (17) reduces the pressure of cooling gas before the trapped ions are ejected from the first ion trap (1) towards a second ion trap (20) for analysis. The pulsed ion source has a sample plate (14) which forms an end wall of the first ion trap (10).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.