Patent · US Active

Method for gap adjustment of two mechanical elements of a substantially planar micromechanical structure and corresponding electromechanical resonator

US7893595B2 · kind B2 · utility

3Cited by
1References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2002
Grant dateFeb 22, 2011
Priority date
Expiry dateJul 12, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03H2009/02496
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

The invention concerns a method for adjusting the operating gap of two mechanical elements of a substantially planar mechanical structure obtained by micro-etching. The method consists in attributing (A) to one of the elements (E) a fixed reference position (RF) in the direction of the residual gap separating said elements; connecting (C) the other element (OE) to the fixed reference position (RF) by an elastic link (S) and installing (D) between the fixed reference position (RF) and the other element (OE) at least a stop block defining an abutting gap, maximum displacement amplitude of the other element; subjecting (DE) the other element (OE) to a displacement antagonistic to the elastic link (S) up to the abutting position constituting the operating position, the residual gap being reduced to the difference between residual gap and abutting gap and less than the resolution of the micro-etching process. The invention is applicable to electromechanical resonators.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.