Calibration apparatus, calibration method, program for calibration, and calibration jig
US7894661B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2003 |
| Grant date | Feb 22, 2011 |
| Priority date | — |
| Expiry date | Nov 27, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/80
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A calibration apparatus which estimates a calibration parameter of an image acquisition apparatus, comprises a calibration jig which includes at least two planes and in which calibration markers having known three-dimensional positions are arranged in each plane based on a predetermined rule. The calibration apparatus further comprises a calibration marker recognition section configured to measure and number in-image positions of the calibration markers in at least one image obtained by photographing the calibration jig by the image acquisition apparatus, and a parameter estimate section configured to estimate the calibration parameters of the image acquisition apparatus by the use of the three-dimensional position and the in-image position of the calibration markers numbered by the calibration marker recognition section.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.