Patent · US Active

Duty cycle measurement for various signals throughout an integrated circuit device

US7895005B2 · kind B2 · utility

0Cited by
18References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 2007
Grant dateFeb 22, 2011
Priority date
Expiry dateJun 2, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31725
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A mechanism is provided for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device. The mechanism employs a circuit having a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured by a same amount. The outputs of the pulse shaper elements may be coupled to substantially identical divider circuits whose outputs are coupled to a multiplexer that selects two inputs for output to a set of master/slave configured flip-flops, one input serving as a clock and the other as data to the flip-flops. The flip-flops sample the divider outputs selected by the multiplexer to detect if the dividers have failed or not. The outputs of the flip-flops are provided to an XOR gate which outputs a duty cycle signal indicative of the duty cycle of the input signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.