Statistical design closure
US7895546B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 4, 2007 |
| Grant date | Feb 22, 2011 |
| Priority date | — |
| Expiry date | Dec 27, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of statistical design closure is disclosed. The method generally includes the steps of (A) reading statistical data from a database, the statistical data defining a plurality of chip yield improvements, one of the chip yield improvements in each one of a plurality of design closure categories respectively, the chip yield improvements capturing historically trends based on a plurality of previous projects, (B) calculating a plurality of targets of a current design closure project based on the statistical data, one of the targets in each one of the design closure categories respectively and (C) generating a resource report to a user that indicates a plurality of resources expected to be used the current design closure project.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.