Patent · US Active

Method for production of a radiation-emitting semiconductor chip

US7897423B2 · kind B2 · utility

3Cited by
6References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 29, 2004
Grant dateMar 1, 2011
Priority date
Expiry dateNov 1, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/018

Abstract

A method for micropatterning a radiation-emitting surface of a semiconductor layer sequence for a thin-film light-emitting diode chip. The semiconductor layer sequence is grown on a substrate. A mirror layer is formed or applied on the semiconductor layer sequence, which reflects back into the semiconductor layer sequence at least part of a radiation that is generated in the semiconductor layer sequence during the operation thereof and is directed toward the mirror layer. The semiconductor layer sequence is separated from the substrate by means of a lift-off method, in which a separation zone in the semiconductor layer sequence is at least partly decomposed in such a way that anisotropic residues of a constituent of the separation zone, in particular a metallic constituent of the separation layer, remain at the separation surface of the semiconductor layer sequence, from which the substrate is separated. The separation surface—provided with the residues—of the semiconductor layer sequence with a dry etching method, a gaseous etchant or a wet-chemical etchant, wherein the anisotropic residues are at least temporarily used as an etching mask. A semiconductor chip is produced accordin…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.