Automated x-ray fluorescence analysis
US7899153B2 · kind B2 · utility
4Cited by
6References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2009 |
| Grant date | Mar 1, 2011 |
| Priority date | — |
| Expiry date | Apr 17, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.