Method, apparatus and system for detecting anomalies in mixed signal devices
US7899237B2 · kind B2 · utility
0Cited by
3References
13Claims
0Family size
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Key dates
| Filing date | Mar 8, 2007 |
| Grant date | Mar 1, 2011 |
| Priority date | — |
| Expiry date | Nov 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An embodiment relates generally to a method of testing a mixed signal device. The method includes monitoring multiple parameters of the mixed signal device and scanning the mixed signal device with an optical source. The method also includes forming multiple windows, where each window is assigned to a respective parameter. The method further includes comparing an image from a respective image to a reference image to determine an existence of an anomaly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.