Patent · US Active

Reversible test probe and test probe tip

US7902848B2 · kind B2 · utility

7Cited by

15References

16Claims

0Family size

Assignee

Fluke Corporation · US

Inventors

Larry Eccleston · Marshall, US
Chris W. Lagerberg · Seattle, US
John Renner, III · Arlington, US
David Gibson · Little Egg Harbor Township, US

Key dates

Filing date	Jan 9, 2009
Grant date	Mar 8, 2011
Priority date	—
Expiry date	Jan 9, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06788
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.