System and methods for the detection of irregularities in objects based on an image of the object
US7903864B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2007 |
| Grant date | Mar 8, 2011 |
| Priority date | — |
| Expiry date | Aug 11, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30152
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for the detection of an irregularity in an object based on an image of the object that includes the steps of binarizing the image at a plurality of binarization thresholds to obtain a plurality of binarized images, extracting information from each of the binarized images, estimating the regular object resulting from the binarization at the respective binarization threshold of an image of a version of the object in which the irregularity is absent, combining the information extracted from each of the binarized images, and detecting the irregularity based on the combined information. A method for the detection of a defect in a solder element based on an X-ray image of the solder element. This aspect includes the steps of binarizing the image at a plurality of binarization thresholds to obtain a plurality of binarized images, extracting information from each of the binarized images, combining the information extracted from each of the binarized images, and detecting the defect based on the combined information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.