Automatic optical inspection system and method
US7903865B2 · kind B2 · utility
2Cited by
12References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2007 |
| Grant date | Mar 8, 2011 |
| Priority date | — |
| Expiry date | Jan 5, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An automatic optical inspection system includes a rotary device for driving an object to rotate. At least one line-scan camera is implemented for generating two-dimensional planar images of cylindrical surfaces of the object. A device for detecting defects is operable to generate the two-dimensional planar images of the cylindrical surfaces of the object according to a normalized grayscale absolute difference inspection method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.