Method and system for standardizing microscope instruments
US7907271B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 13, 2008 |
| Grant date | Mar 15, 2011 |
| Priority date | — |
| Expiry date | Feb 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/6439
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.