System to estimate X-ray scatter
US7907697B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 21, 2008 |
| Grant date | Mar 15, 2011 |
| Priority date | — |
| Expiry date | Jan 7, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/005
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system may include determination of a first scatter kernel based on a first energy, a material-equivalent radiological thickness and a first diameter, wherein the first scatter kernel is not a monotonically decreasing function of radial coordinate, determination of a second scatter kernel based on the first energy, the material-equivalent radiological thickness and a second diameter greater than the first diameter, determination of a third scatter kernel based on the first scatter kernel and the second scatter kernel, wherein the third scatter kernel is a monotonically decreasing function of radial coordinate, and estimation of scatter radiation within the projection image of the object based on the third scatter kernel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.