Memory module and on-line build-in self-test method thereof for enhancing memory system reliability
US7908530B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 16, 2009 |
| Grant date | Mar 15, 2011 |
| Priority date | — |
| Expiry date | Nov 6, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory module including a plurality of memory banks, a memory control unit, and a built-in self-test (BIST) control unit is provided. The memory banks store data. The memory control unit accesses the data in accordance with a system command. The BIST control unit generates a BIST command to the memory control unit when a BIST function is enabled in the memory module. While the system command accessing the data in a specific memory bank exists, the memory command control unit has the priority to execute the system command instead of the BIST command testing the specific memory bank. Memory reliability of a system including the memory module is enhanced without reducing the system effectiveness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.