Holographic interferometry for non-destructive testing of power sources
US7911618B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | May 16, 2008 |
| Grant date | Mar 22, 2011 |
| Priority date | — |
| Expiry date | Aug 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/021
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.