Method and device for measuring dynamic parameters of particles
US7912274B2 · kind B2 · utility
1Cited by
13References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2006 |
| Grant date | Mar 22, 2011 |
| Priority date | — |
| Expiry date | May 27, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method and device for measuring dynamic parameters of particles comprises applying time correlation analysis on fluctuation of the particles with respect to a detection area of a digital picture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.