Method of evaluating the quality of a lapping plate
US7914362B2 · kind B2 · utility
2Cited by
17References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2005 |
| Grant date | Mar 29, 2011 |
| Priority date | — |
| Expiry date | Jan 27, 2028 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB24B49/00
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
Embodiments of the present invention pertain to a evaluating the quality of a lapping plate. In one embodiment, information that indicates the quality of a lapping plate is received while the lapping plate is being used to lap a slider, and the information is used to evaluate the quality of the lapping plate while the lapping plate is being used to lap the slider.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.