Complementary anti-aliasing sample patterns
US7916155B1 · kind B1 · utility
30Cited by
5References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 2, 2007 |
| Grant date | Mar 29, 2011 |
| Priority date | — |
| Expiry date | Dec 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for producing anti-aliased images use a sub-pixel sample pattern set that includes two or more unique sub-pixel sample patterns that are complementary. The sub-pixel sample patterns are offset from each pixel center and used to produce images that are combined to produce the anti-aliased image. In addition to providing sub-pixel coverage information, the sub-pixel sample pattern sets may be used to produce sub-pixel shading information. Furthermore, the sub-pixel sample pattern sets may be used in single processor systems or in multiprocessor systems to produce anti-aliased images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.