Defect resolution methodology and target assessment process with a software system
US7917897B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2007 |
| Grant date | Mar 29, 2011 |
| Priority date | — |
| Expiry date | Jan 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3604
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.