Patent · US Active

Laser crystallization method for amorphous semiconductor thin film

US7919366B2 · kind B2 · utility

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10References
2Claims
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Key dates

Filing dateOct 9, 2009
Grant dateApr 5, 2011
Priority date
Expiry dateOct 9, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S117/904
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A laser crystallization method in which an amorphous silicon thin film 2 formed on a substrate 1 is irradiated with a laser beam, the method including the steps of providing the amorphous silicon thin film 2 with an absorbent to form an absorbent layer 3 on the desired specific local areas of the amorphous silicon thin film 2 and laser annealing for crystallizing the specific local areas of the amorphous silicon thin film 2 by irradiating the amorphous silicon thin film 2 including the specific local areas with a semiconductor laser beam L having a specific wavelength absorbable by the absorbent layer 3 and unabsorbable by the amorphous silicon thin film 2 for heating the absorbent layer 3.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.