Patent · US Active

Optical standard for the calibration and characterization of optical measuring devices

US7919744B2 · kind B2 · utility

2Cited by

2References

18Claims

0Family size

Assignee

BAM Bundesanstalt fuer Materialforschung und-pruefung · DE

Inventors

Ute Resch-Genger · Berlin, DE
Katrin Hoffmann · Berlin, DE
Thomas Behnke · Berlin, DE
Christian Wuerth · Berlin, DE

Key dates

Filing date	Jul 20, 2009
Grant date	Apr 5, 2011
Priority date	—
Expiry date	Jul 29, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/64
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to an optical standard (10) for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard (10) according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules (12) having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules (12) in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules (12) are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces (12.1).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.