System and method for distortion analysis
US7919968B2 · kind B2 · utility
1Cited by
4References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 9, 2007 |
| Grant date | Apr 5, 2011 |
| Priority date | — |
| Expiry date | Nov 12, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.