Non-contact method and system for inspecting parts
US7920278B2 · kind B2 · utility
18Cited by
40References
24Claims
0Family size
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Key dates
| Filing date | Sep 19, 2008 |
| Grant date | Apr 5, 2011 |
| Priority date | — |
| Expiry date | Jun 4, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A non-contact method and system for inspecting parts using two different types of machine vision methodologies are provided. The system has enhanced versatility and includes a triangulation-based subsystem to obtain triangulation-based sensor data, a radiation plane-based profile inspection subsystem to obtain shadowed radiation plane-based sensor data and a data processor for processing or fusing the triangulation-based sensor data and the shadowed radiation plane-based sensor data to obtain dimensional information related to the part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.