Determining calibration information for an x-ray apparatus

US7922391B2 · kind B2 · utility

Assignee

• Brainlab AG · DE

Inventors

• Robert Essenreiter · Munich, DE
• Michael Bertram · Borgo San Lazzaro, DE
• Martin Ringholz · Erlangen, DE

Key dates

• Filing date: May 6, 2009
• Grant date: Apr 12, 2011
• Expiry date: May 6, 2029

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B2090/376
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

A device and method are provided that enable calibration information to be determined for an x-ray apparatus that performs a three-dimensional x-ray scan. The calibration information is determined using an adapting method, wherein the adapting method is based on a position of an x-ray source relative to an x-ray unit marker device during image acquisition, an x-ray unit data set that describes the position of the x-ray unit marker device during image acquisition, and a two-dimensional calibration data set that describes at least one and preferably two actual two-dimensional x-ray images produced by irradiating a calibration object.