Patent · US Expired

Procedure for testing the function of a lamp circuit

US7924021B2 · kind B2 · utility

1Cited by

8References

9Claims

0Family size

Assignee

Conti Temic microelectronic GmbH · DE

Inventors

Uli Joos · Nonnenhorn, DE
Jochen Zwick · Markdorf, DE
Nicolai Jeutner · Bad Mergentheim, DE

Key dates

Filing date	Nov 19, 2004
Grant date	Apr 12, 2011
Priority date	—
Expiry date	Nov 5, 2025

Classification

Technology area (CPC H)Electricity
CPC primaryH05B47/21
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The function of a lamp circuit is tested by measuring the current and voltage. A resistance value is taken into account which is specified as a polynomial of at least the 1st order depending on the effective measured voltage on the lamp circuit. The parameters of the polynomial are determined by a quantity of measurements which correspond to the order of the polynomial, under operating conditions which are known to differ, and the specific resistance value or a value derived from it are compared with a specified value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.