Method and system for processing texture samples with programmable offset positions
US7924290B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | May 30, 2007 |
| Grant date | Apr 12, 2011 |
| Priority date | — |
| Expiry date | Feb 9, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for performing a texture operation with user-specified offset positions are disclosed. Specifically, one embodiment of the present invention sets forth a method, which includes the steps of deriving a first destined texel position based on an original sample position associated with a pixel projected in a texture map and a first offset position specified by a user and fetching texel attributes at the first destined texel position for the texture operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.