In-line inspection system for vertically profiling plastic containers using multiple wavelength discrete spectral light sources
US7924421B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2007 |
| Grant date | Apr 12, 2011 |
| Priority date | — |
| Expiry date | Apr 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3181
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for in-line inspection of plastic blow molded containers. The inspection system may comprise a plurality of emitter assemblies arranged in a vertical array. Each emitter assembly may cyclically emit light energy in at least two different narrow wavelength bands at a container as the container passes through an inspection area. The system may also comprise a plurality of broadband photodetectors arranged in a vertical array, each photodetector facing at least one of the emitter assemblies with the inspection area therebetween such that the photodetectors are capable of sensing light energy that passes through the container when it is in the inspection area. The system may also comprise a processor in communication with the photodetectors for determining a characteristic of the container based on signals from the photodetectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.